Keysight Technologies collaborate with NCUOSC to set up 3rd gen R&D lab

Keysight Technologies Inc. has reportedly announced a collaboration with the NCUOSC (National Central University Optical Sciences Center) to enhance the design and test validation efficiency of silicon carbide (SiC) and gallium nitride (GaN) applications, expediting the pace of innovation in electric vehicle (EV) and 5G.

NCUOSC has utilized the PD1500A Dynamic Power Device Analyzer/DPT (Double Pulse Tester) platform of Keysight to set up a third gen WBG (Wide-band gap) semiconductor open laboratory to enhance the developing and testing efficiency. Standardized tests have started to emerge as the JEDEC, a leading developer of open publications and standards for the microelectronics industry, continues to interpret the dynamic testing of WBG devices.

WBG materials like SiC and GaN provide low loss, rapid switching speeds, and can withstand high voltage as well as temperature characteristics. Owing to this, the materials are used in fast charging, consumer power products, rail transit, electric vehicles along with 5G data center servers and infrastructures. However, these benefits increase the complexity of design as well as testing.

Thomas Goetzl, the General Manager and Vice President of the Automotive and Energy Solutions business unit of Keysight, commented that the company is delighted to collaborate with NCUOSC to help engineering teams understand, characterize, integrate, drive and deploy innovations for next-gen semiconductor technologies.

Professor Yue-Ming Hsin, the Director of NCUOSC, also stated that the PD1500A DPT of Keysight allows the center to reliably characterize WBG devices and innovate SiC and GaN applications effectively. Its optional and scalable test fixtures and safety protection deliver the flexibility necessary for future expansions.

Repeatable and reliable measurements are crucial to expediting design and validation for novel technologies which includes WBG semiconductors. The PD1500A DPT’s intelligent functions, like JEDEC and IEC standard-based fully automatic parameter extraction software, voltage and current sweep testing, loop testing as well as automatic high-temperature testing can help in driving future innovations.

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